Radiation effects and mitigation strategies for modern FPGAs

Field Programmable Gate Array devices have become the technology of choice in small volume modern instrumentation and control systems. These devices have always offered significant advantages in flexibility, and recent advances in fabrication have greatly increased logic capacity, substantially increasing the number of applications for this technology. Unfortunately, the increased density (and corresponding shrinkage of process geometry), has made these devices more susceptible to failure due to external radiation. This has been an issue for space based systems for some time, but is now becoming an issue for terrestrial systems in elevated radiation environments and commercial avionics as well. Characterizing the failure modes of Xilinx FPGAs, and developing mitigation strategies is the subject of ongoing research by a consortium of academic, industrial, and governmental laboratories. This paper presents background information of radiation effects and failure modes, as well as current and future mitigation techniques. In particular, the availability of very large FPGA devices, complete with generous amounts of RAM and embedded processor(s), has led to the implementation of complete digital systems on a single device, bringing issues of system reliability and redundancy management to the chip level. Radiation effects on a single FPGA are increasingly likely to have system level consequences, and will need to be addressed in current and future designs.